Contactless Functionality Inspection of Flat-Panel-Display Pixels and Thin-Film Transistors by Capacitive Coupling

Koerdel M, Alatas F, Schick A, Jongman J, Sekhar C, Rupitsch S, Lerch R (2012)

Publication Status: Published

Publication Type: Journal article

Publication year: 2012

Journal

IEEE Transactions on Electron Devices Institute of Electrical and Electronics Engineers (IEEE)

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Book Volume: 59

Pages Range: 3411-3418

Journal Issue: 12

DOI: 10.1109/TED.2012.2220362

Abstract

A fast and thorough detection of structural and functional defects of flat-panel displays, large-area image detectors, and printed electronics requires a contactless and flexible inspection technique. Moreover, to accelerate the development of new products and to increase yields, efficient device characterization including the analysis of single component functionality and testing under operating conditions is essential. In this contribution, a contactless inspection method solely based on capacitive coupling is used to analyze pixel and thin-film transistor (TFT) functionality of active-matrix liquid crystal and electrophoretic display backplanes. Employing a capacitively coupled sensor, the measurement of the evolution of the pixel electrode voltage during TFT operation (switching) yields display flicker and TFT parameters, such as TFT ON- and OFF-currents, TFT threshold, and intrinsic capacitance. To confirm the measurement results, the pixel voltage was also measured with an active voltage probe brought into contact with the pixel electrodes under test.

Authors with CRIS profile

Stefan Rupitsch Lehrstuhl für Autonome Systeme und Mechatronik Reinhard Lerch Lehrstuhl für Autonome Systeme und Mechatronik

Involved external institutions

Siemens AG DE Germany (DE) Plastic Logic Ltd GB United Kingdom (GB)

How to cite

APA:

Koerdel, M., Alatas, F., Schick, A., Jongman, J., Sekhar, C., Rupitsch, S., & Lerch, R. (2012). Contactless Functionality Inspection of Flat-Panel-Display Pixels and Thin-Film Transistors by Capacitive Coupling. IEEE Transactions on Electron Devices, 59(12), 3411-3418. https://doi.org/10.1109/TED.2012.2220362

MLA:

Koerdel, Martin, et al. "Contactless Functionality Inspection of Flat-Panel-Display Pixels and Thin-Film Transistors by Capacitive Coupling." IEEE Transactions on Electron Devices 59.12 (2012): 3411-3418.

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