Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ

Beitrag in einer Fachzeitschrift
(Originalarbeit)


Details zur Publikation

Autorinnen und Autoren: Munnecke A, Servais T
Zeitschrift: Acta Universitatis Carolinae - Geologica
Verlag: Univerzita Karlova
Jahr der Veröffentlichung: 1996
Band: 40
Seitenbereich: 549-553
ISSN: 0001-7132


Abstract


Scanning electron microscopy of polished, slightly etched rock

surfaces provides excellcnt observation conditions for

palynomorphs. ln the present study, samples from micritic Iimestone-

marl altemations in the Silurian of Gotland, Sweden, and

from Pliocene Iimestones of the Bahamas are used.

 



FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Munnecke, Axel Prof. Dr.
Naturwissenschaftliche Fakultät


Zitierweisen

APA:
Munnecke, A., & Servais, T. (1996). Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ. Acta Universitatis Carolinae - Geologica, 40, 549-553.

MLA:
Munnecke, Axel, and Thomas Servais. "Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ." Acta Universitatis Carolinae - Geologica 40 (1996): 549-553.

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