Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ

Munnecke A, Servais T (1996)


Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1996

Journal

Publisher: Univerzita Karlova

Book Volume: 40

Pages Range: 549-553

URI: https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=3342920651&origin=inward

Abstract

Scanning electron microscopy of polished, slightly etched rock
surfaces provides excellcnt observation conditions for
palynomorphs. ln the present study, samples from micritic Iimestone-
marl altemations in the Silurian of Gotland, Sweden, and
from Pliocene Iimestones of the Bahamas are used.
 

Authors with CRIS profile

How to cite

APA:

Munnecke, A., & Servais, T. (1996). Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ. Acta Universitatis Carolinae - Geologica, 40, 549-553.

MLA:

Munnecke, Axel, and Thomas Servais. "Scanning electron microscopy of polished, slightly etched surfaces of Silurian limestones from Gotland: A method to observe acritarchs in situ." Acta Universitatis Carolinae - Geologica 40 (1996): 549-553.

BibTeX: Download