Ultrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT)

Scharrer T, Koch A, Fendt K, Rupitsch S, Sutor A, Ermert H, Lerch R (2012)

Publication Language: English

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2012

Pages Range: 1039-1042

Article Number: 6561937

Conference Proceedings Title: 2012 IEEE International Ultrasonics Symposium Proceedings

Event location: Dresden DE

ISBN: 9781467345613

DOI: 10.1109/ULTSYM.2012.0260

Abstract

This paper describes an improved synthetic-aperture-focusing-technique (SAFT) for ultrasonic defect detection in multi-material devices with a circular cylindrical geometry. In conventional SAFT, defect imaging resolution in such specimen is limited, due to refraction at material interfaces. Hence, the improved technique allows to increase the probability of detection (POD) and the resolution of defects in multi-material, axis-symmetric devices. Especially, if defects are located in layers far away from the device surface and the discrepancies in the speed of sound (SOS) of the specimen materials are thoroughly substantial, it is indispensable to implicate refraction effects in the SAFT processing. Thereby, the examination is divided into three major steps. First, a specimen is scanned by rotating a spherically focused immersion ultrasound transducer around it. In a second step, a corrected time of flight (TOF) distribution is calculated by a fast marching method (FMM) with the à-priori knowledge of the specimen layout and the different SOS in the materials. As third and last step, the improved SAFT is performed utilizing the TOF distribution. To verify improvements in comparison to a conventional SAFT, a specimen is inspected, consisting of a steel and a polyvinyl chloride (PVC) part. © 2012 IEEE.

Authors with CRIS profile

Thomas Scharrer Lehrstuhl für Autonome Systeme und Mechatronik Andreas Koch Lehrstuhl für Autonome Systeme und Mechatronik Karl Fendt Lehrstuhl für Autonome Systeme und Mechatronik Stefan Rupitsch Lehrstuhl für Autonome Systeme und Mechatronik Alexander Sutor Lehrstuhl für Autonome Systeme und Mechatronik Helmut Ermert Lehrstuhl für Hochfrequenztechnik Reinhard Lerch Lehrstuhl für Autonome Systeme und Mechatronik

How to cite

APA:

Scharrer, T., Koch, A., Fendt, K., Rupitsch, S., Sutor, A., Ermert, H., & Lerch, R. (2012). Ultrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT). In 2012 IEEE International Ultrasonics Symposium Proceedings (pp. 1039-1042). Dresden, DE.

MLA:

Scharrer, Thomas, et al. "Ultrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT)." Proceedings of the 2012 IEEE International Ultrasonics Symposium, IUS 2012, Dresden 2012. 1039-1042.

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