Pulsed direct flame deposition and thermal annealing of transparent amorphous indium zinc oxide films as active layers in field effect transistors

Kilian D, Polster S, Vogeler I, Frey L, Jank M, Peukert W (2014)

Publication Language: English

Publication Type: Journal article

Publication year: 2014

Journal

Book Volume: 6

Pages Range: 12245-12251

Journal Issue: 15

DOI: 10.1021/am501837u

Abstract

Indium-zinc oxide (IZO) films were deposited via flame spray pyrolysis (FSP) by pulsewise shooting a Si/SiO2 substrate directly into the combustion area of the flame. Based on UV-vis measurements of thin-films deposited on glass substrates, the optimal deposition parameters with respect to low haze values and film thicknesses of around 100 nm were determined. Thermal annealing of the deposited films at temperatures between 300 and 700 °C was carried out and staggered bottom gate thin-film transistors (TFT) were fabricated. The thin films were investigated by scanning electron microscopy, atomic force microscopy, X-ray diffraction, Fourier transformed infrared spectroscopy, and room-temperature photoluminescence measurements. The outcome of these investigations lead to two major requirements in order to implement a working TFT: (i) organic residues from the deposition process need to be removed and (ii) the net free charge carrier concentration has to be minimized by controlling the trap states in the semiconductor. The optimal annealing temperature was 300 °C as both requirements are fulfilled best in this case. This leads to field effect transistors with a low hysteresis, a saturation mobility of μSat = 0.1 cm²/(V s), a threshold voltage of Vth = -18.9 V, and an Ion/Ioff ratio on the order of 10⁷. Depending on thermal treatment, the defect density changes significantly strongly influencing the transfer characteristics of the device. © 2014 American Chemical Society.

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APA:

Kilian, D., Polster, S., Vogeler, I., Frey, L., Jank, M., & Peukert, W. (2014). Pulsed direct flame deposition and thermal annealing of transparent amorphous indium zinc oxide films as active layers in field effect transistors. ACS Applied Materials and Interfaces, 6(15), 12245-12251. https://doi.org/10.1021/am501837u

MLA:

Kilian, Daniel, et al. "Pulsed direct flame deposition and thermal annealing of transparent amorphous indium zinc oxide films as active layers in field effect transistors." ACS Applied Materials and Interfaces 6.15 (2014): 12245-12251.

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