Chemical and structural characterisation of DGEBA-based expocies by Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) as a preliminary to polymer interphase characterisation

Possart G, Steinmann P, Passlack S, Brodyanski A, Kopnarski M, Presser M, Geiß PL, Bock W (2009)

Publication Type: Journal article, Original article

Publication year: 2009

Journal

Analytical and Bioanalytical Chemistry Springer

Publisher: Springer Verlag (Germany)

Book Volume: 398

Pages Range: 1879-1888

Journal Issue: 8

DOI: 10.1007/s00216-009-2639-6

Authors with CRIS profile

Gunnar Possart Lehrstuhl für Technische Mechanik Paul Steinmann Lehrstuhl für Technische Mechanik

How to cite

APA:

Possart, G., Steinmann, P., Passlack, S., Brodyanski, A., Kopnarski, M., Presser, M.,... Bock, W. (2009). Chemical and structural characterisation of DGEBA-based expocies by Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) as a preliminary to polymer interphase characterisation. Analytical and Bioanalytical Chemistry, 398(8), 1879-1888. https://doi.org/10.1007/s00216-009-2639-6

MLA:

Possart, Gunnar, et al. "Chemical and structural characterisation of DGEBA-based expocies by Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) as a preliminary to polymer interphase characterisation." Analytical and Bioanalytical Chemistry 398.8 (2009): 1879-1888.

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