Analysis of large MIMO DS-CDMA systems with imperfect CSI and spatial correlation

Vehkaperä M, Takeuchi K, Müller R, Tanaka T (2010)

Publication Language: English

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2010

Pages Range: 2098-2102

Article Number: 5513401

Event location: Austin, TX US

ISBN: 9781424469604

DOI: 10.1109/ISIT.2010.5513401

Abstract

The large system analysis of randomly spread MIMO DS-CDMA systems is provided. Correlated Rayleigh fading MIMO channels are assumed for all users. Linear multiuser detection with separate decoding and pilot-aided channel estimation are used. The results imply that with channel estimation, the performance can improve significantly as the correlation between the transmit antennas increases. No channel information at the transmitter is required, but the channel estimator needs knowlegde of the long term transmit correlation in advance. The numerical results demonstrate that in a 4 × 4 MIMO DS-CDMA system with two users per chip, high antenna correlation at the transmitter can double the ergodic spectral efficiency compared to the case of uncorrelated transmit antennas. © 2010 IEEE.

Authors with CRIS profile

Ralf Müller Professur für Informationsübertragung

Involved external institutions

Kyoto University / 京都大学 Kyōto daigaku JP Japan (JP) NTNU Trondheim - Norwegian University of Science and Technology NO Norway (NO) University of Electro-Communications / 電気通信大学 (Denki-Tsūshin Daigaku) JP Japan (JP)

How to cite

APA:

Vehkaperä, M., Takeuchi, K., Müller, R., & Tanaka, T. (2010). Analysis of large MIMO DS-CDMA systems with imperfect CSI and spatial correlation. In IEEE (Eds.), Proceedings of the 2010 IEEE International Symposium on Information Theory, ISIT 2010 (pp. 2098-2102). Austin, TX, US.

MLA:

Vehkaperä, Mikko, et al. "Analysis of large MIMO DS-CDMA systems with imperfect CSI and spatial correlation." Proceedings of the 2010 IEEE International Symposium on Information Theory, ISIT 2010, Austin, TX Ed. IEEE, 2010. 2098-2102.

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