Talai A, Gmeiner B, Weigel R, Kölpin A (2014)
Publication Type: Conference contribution, Abstract of lecture
Publication year: 2014
Publisher: CST Computer Simulation Technology AG
Pages Range: 1-20
Event location: Berlin
URI: https://www.cst.com/Content/Events/Downloads/euc2014/5.4.2.pdf
The shapes of microstrip line edges comprise a large influence on various microwave circuitry characteristics. Therefore, the edges of thick film gold conductor tracks have been analyzed by scanning electron microscopy and rebuilt in 3D according to the measured fringing dimensions of co-fired and post-fired conductor tracks on Low Temperature Cofired Ceramic (LTCC). Subsequent time-domain field simulations with CST from 0 GHz to 110 GHz reveal the influence of fringed conductor edges on metallization loss, scattering parameters and the effective permittivity, which will be presented. Simulations of fringed Microstrips on porosified LTCC are compared to the dense case. It is shown that fraying has less impact on porosified LTCC, since the relative permittivity at the near-surface region is strongly reduced by the introduced air.
APA:
Talai, A., Gmeiner, B., Weigel, R., & Kölpin, A. (2014, May). Electromagnetic Analysis of Fringed Microstrip Lines on Dense and Porosified LTCC. Paper presentation at Computer Simulation Technology - European User Conference, Berlin.
MLA:
Talai, Armin, et al. "Electromagnetic Analysis of Fringed Microstrip Lines on Dense and Porosified LTCC." Presented at Computer Simulation Technology - European User Conference, Berlin CST Computer Simulation Technology AG, 2014.
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