High Sensitivity photoelectron yield spectroscopy with computer-calculated electron optics

Ristein J, Ley L (1993)


Publication Type: Journal article

Publication year: 1993

Journal

Publisher: American Institute of Physics (AIP)

Book Volume: 64

Pages Range: 653

DOI: 10.1063/1.1144192

Abstract

An improved spectrometer design for photoelectron yield spectroscopy is described. Basis of the new spectrometer is a computer-designed electron optics that images the emission spot into the electron multiplier and thereby improves the sensitivity for electrons emitted from the sample. The collection efficiency was experimentally determined to 98.3%. A background of stray electrons which limits the ultimate sensitivity of the method could be substantially reduced by minimizing multiple beam reflections and by coating critical surfaces with a high work function material such as platinum. As a result, photoyield spectra of Au with a dynamical range of ten orders of magnitude are routinely obtained.

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How to cite

APA:

Ristein, J., & Ley, L. (1993). High Sensitivity photoelectron yield spectroscopy with computer-calculated electron optics. Review of Scientific Instruments, 64, 653. https://dx.doi.org/10.1063/1.1144192

MLA:

Ristein, Jürgen, and Lothar Ley. "High Sensitivity photoelectron yield spectroscopy with computer-calculated electron optics." Review of Scientific Instruments 64 (1993): 653.

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