Performance Analysis and Design of STBC's for Fading ISI Channels

Beitrag bei einer Tagung

Details zur Publikation

Autorinnen und Autoren: Schober R, Gerstacker W, Lampe L
Titel Sammelwerk: IEEE International Conference on Communications
Verlag: Institute of Electrical and Electronics Engineers
Jahr der Veröffentlichung: 2002
Tagungsband: Conference Proceedings
Seitenbereich: 1451-1455
ISSN: 0536-1486
Sprache: Englisch


In this paper, space-time block-coded transmission over fading intersymbol interference (ISI) channels is investigated. A lower bound on the pairwise error probability for optimum detection is given. Also an approximation for the bit error rate is derived and compared with simulation results for maximum-likelihood sequence estimation (MLSE) for the GSM/EDGE (Enhanced Data Rates for GSM Evolution) system. Furthermore, a novel design rule for space-time block codes (STBC's) with arbitrary rate for fading ISI channels is provided. A corresponding full-rate code is designed and shown to yield higher performance than Alamouti's code. It is demonstrated that for fading channels with L independent impulse response coefficients, full-rate STBC's designed for the flat fading channel can achieve at most a diversity order of (NT + L - 1)NR if NT transmit antennas and NR receive antennas are used. On the other hand, the maximum diversity order employing the proposed code design rule is LNT NR.

FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Gerstacker, Wolfgang Prof. Dr.
Lehrstuhl für Digitale Übertragung
Schober, Robert Prof. Dr.-Ing.
Lehrstuhl für Digitale Übertragung


Schober, R., Gerstacker, W., & Lampe, L. (2002). Performance Analysis and Design of STBC's for Fading ISI Channels. In Conference Proceedings (pp. 1451-1455). New York, NY, US: Institute of Electrical and Electronics Engineers.

Schober, Robert, Wolfgang Gerstacker, and Lutz Lampe. "Performance Analysis and Design of STBC's for Fading ISI Channels." Proceedings of the International Conference on Communications (ICC '02), New York, NY Institute of Electrical and Electronics Engineers, 2002. 1451-1455.


Zuletzt aktualisiert 2019-25-07 um 10:53