Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Neuhold A, Fladischer S, Mitsche S, Flesch HG, Moser A, Novak J, Smilgies DM, Kraker E, Lamprecht B, Haase A, Grogger W, Resel R (2011)

Publication Status: Published

Publication Type: Journal article

Publication year: 2011

Journal

Journal of Applied Physics AIP Publishing

Publisher: American Institute of Physics (AIP)

Book Volume: 110

Journal Issue: 11

DOI: 10.1063/1.3667171

Abstract

The internal morphology and crystallographic properties of a complete organic thin film multilayer stack are characterized via x-ray scattering techniques, atomic force microscopy (AFM), and scanning electron microscopy. The stack consists of the three organic layers - copper(II) phthalocyanine (CuPc), perylene tetracarboxylic bisbenzimidazole (PTCBI), and aluminum-tris(8-hydroxychinolin) (Alq(3)) - sandwiched between an optically semitransparent gold layer and a top silver electrode. The interface roughness progress is determined by the x-ray reflectivity, which is confirmed by the surface roughness determination via AFM. The crystallographic properties are characterized via x-ray diffraction. The CuPc layer is highly crystalline with preferentially oriented crystallites but forms a rough interface (sigma(RMS) = 5.5 nm) toward the PTCBI layer. The PTCBI layer grows with randomly distributed crystallites in a worm-like morphology with an interface roughness of sigma(RMS) = 6.4 nm toward the Alq(3) layer. The amorphous Alq(3) layer acts as smoothing layer and reduces the roughness sigma(RMS) to 5.8 nm. Within this study we demonstrate the applicability of x-ray reflectivity in characterizing the interface morphology of an organic multilayer stack device. (C) 2011 American Institute of Physics. [doi:10.1063/1.3667171]

Authors with CRIS profile

Stefanie Rechberger Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

Involved external institutions

Technische Universität Graz AT Austria (AT) JOANNEUM RESEARCH Forschungsgesellschaft mbH AT Austria (AT) Cornell University US United States (USA) (US)

How to cite

APA:

Neuhold, A., Fladischer, S., Mitsche, S., Flesch, H.-G., Moser, A., Novak, J.,... Resel, R. (2011). Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. Journal of Applied Physics, 110(11). https://dx.doi.org/10.1063/1.3667171

MLA:

Neuhold, Alfred, et al. "Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study." Journal of Applied Physics 110.11 (2011).

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