Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autorinnen und Autoren: Neuhold A, Fladischer S, Mitsche S, Flesch HG, Moser A, Novak J, Smilgies DM, Kraker E, Lamprecht B, Haase A, Grogger W, Resel R
Zeitschrift: Journal of Applied Physics
Verlag: American Institute of Physics (AIP)
Jahr der Veröffentlichung: 2011
Band: 110
Heftnummer: 11
ISSN: 0021-8979


Abstract


The internal morphology and crystallographic properties of a complete organic thin film multilayer stack are characterized via x-ray scattering techniques, atomic force microscopy (AFM), and scanning electron microscopy. The stack consists of the three organic layers - copper(II) phthalocyanine (CuPc), perylene tetracarboxylic bisbenzimidazole (PTCBI), and aluminum-tris(8-hydroxychinolin) (Alq(3)) - sandwiched between an optically semitransparent gold layer and a top silver electrode. The interface roughness progress is determined by the x-ray reflectivity, which is confirmed by the surface roughness determination via AFM. The crystallographic properties are characterized via x-ray diffraction. The CuPc layer is highly crystalline with preferentially oriented crystallites but forms a rough interface (sigma(RMS) = 5.5 nm) toward the PTCBI layer. The PTCBI layer grows with randomly distributed crystallites in a worm-like morphology with an interface roughness of sigma(RMS) = 6.4 nm toward the Alq(3) layer. The amorphous Alq(3) layer acts as smoothing layer and reduces the roughness sigma(RMS) to 5.8 nm. Within this study we demonstrate the applicability of x-ray reflectivity in characterizing the interface morphology of an organic multilayer stack device. (C) 2011 American Institute of Physics. [doi:10.1063/1.3667171]



FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Rechberger, Stefanie Dr.
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)


Zusätzliche Organisationseinheit(en)
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


Einrichtungen weiterer Autorinnen und Autoren

Cornell University
JOANNEUM RESEARCH Forschungsgesellschaft mbH
Technische Universität Graz


Zitierweisen

APA:
Neuhold, A., Fladischer, S., Mitsche, S., Flesch, H.-G., Moser, A., Novak, J.,... Resel, R. (2011). Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study. Journal of Applied Physics, 110(11). https://dx.doi.org/10.1063/1.3667171

MLA:
Neuhold, Alfred, et al. "Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study." Journal of Applied Physics 110.11 (2011).

BibTeX: 

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