Flux-enhanced monochromator by ultrasound excitation of annealed Czochralski-grown silicon crystals

Hock R (2003)


Publication Status: Published

Publication Type: Journal article

Publication year: 2003

Journal

Publisher: SPRINGER

Book Volume: 76

Pages Range: 935-938

Journal Issue: 6

DOI: 10.1007/s003390201416

Abstract

The neutron flux from monochromator crystals can be increased by ultrasound excitation or by strain fields. Rocking curves of both a perfect float-zone silicon crystal and an annealed Czochralski silicon crystal with oxygen precipitates were measured at various levels of ultrasound excitation on a cold-neutron backscattering spectrometer. We find that the effects of the dynamic strain field from the ultrasound and the static strain field from the defects are not additive. Rocking curves were also taken at different ultrasound frequencies near resonance of the crystal/ultrasound-transducer system with a time resolution of 1 min. Pronounced effects of crystal heating are observed, which render the conditions for maximum neutron reflectivity delicate.

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How to cite

APA:

Hock, R. (2003). Flux-enhanced monochromator by ultrasound excitation of annealed Czochralski-grown silicon crystals. Applied Physics A: Materials Science and Processing, 76(6), 935-938. https://dx.doi.org/10.1007/s003390201416

MLA:

Hock, Rainer. "Flux-enhanced monochromator by ultrasound excitation of annealed Czochralski-grown silicon crystals." Applied Physics A: Materials Science and Processing 76.6 (2003): 935-938.

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