A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autor(en): Hock R
Zeitschrift: Journal of Applied Crystallography
Verlag: BLACKWELL MUNKSGAARD
Jahr der Veröffentlichung: 2004
Band: 37
Seitenbereich: 901-910
ISSN: 0021-8898


Abstract


A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator and analyser. Their integrated reflectivity is about ten times higher than the ideal crystal value. With the same material as the sample, and working with the W Kalpha line at 60 keV in symmetric Laue geometry for all axes, the full width at half-maximum (FWHM) values for the longitudinal and transversal resolution are 2.5 x 10(-3) and 1.1 x 10(-4) for DeltaQ/Q, respectively, and the peak intensity for a non-dispersive setting is 3000 counts s(-1). In particular, for a double-axis mode, an energy well above 100 keV from the Bremsstrahlung spectrum can be used readily. High-energy X-rays are distinguished by a high penetration power and materials of several centimetre thickness can be analysed. The feasibility of performing experiments with massive sample environments is demonstrated.



FAU-Autoren / FAU-Herausgeber

Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik

Zuletzt aktualisiert 2018-10-08 um 16:08