Multi-pass Shack-Hartmann planeness test: monitoring thermal stress

Schwider J, Leuchs G (2010)

Publication Type: Journal article

Publication year: 2010

Journal

Optics Express Optical Society of America

Book Volume: 18

Pages Range: 8094--8106

Authors with CRIS profile

Johannes Schwider Naturwissenschaftliche Fakultät Gerhard Leuchs Lehrstuhl für Experimentalphysik (Optik)

How to cite

APA:

Schwider, J., & Leuchs, G. (2010). Multi-pass Shack-Hartmann planeness test: monitoring thermal stress. Optics Express, 18, 8094--8106.

MLA:

Schwider, Johannes, and Gerd Leuchs. "Multi-pass Shack-Hartmann planeness test: monitoring thermal stress." Optics Express 18 (2010): 8094--8106.

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