Applying computational geometry techniques for advanced feature analysis in atom probe data

Felfer P, Ceguerra A, Ringer S, Cairney J (2013)

Publication Status: Published

Publication Type: Journal article

Publication year: 2013

Journal

Ultramicroscopy Elsevier

Publisher: Elsevier

Book Volume: 132

Pages Range: 100-106

DOI: 10.1016/j.ultramic.2013.03.004

Abstract

In this paper we present new methods for feature analysis in atom probe tomography data that have useful applications in materials characterisation. The analysis works on the principle of Voronoi subvolumes and piecewise linear approximations, and feature delineation based on the distance to the centre of mass of a subvolume (DCOM). Based on the coordinate systems defined by these approximations, two examples are shown of the new types of analyses that can be performed. The first is the analysis of line-like-objects (i.e dislocations) using both proxigrams and line-excess plots. The second is interfacial excess mapping of an InGaAs quantum dot. (C) 2013 Elsevier B.V. All rights reserved,

Authors with CRIS profile

Peter Felfer Professur für Atom Probe Tomography

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Involved external institutions

University of Sydney (USYD) AU Australia (AU)

How to cite

APA:

Felfer, P., Ceguerra, A., Ringer, S., & Cairney, J. (2013). Applying computational geometry techniques for advanced feature analysis in atom probe data. Ultramicroscopy, 132, 100-106. https://dx.doi.org/10.1016/j.ultramic.2013.03.004

MLA:

Felfer, Peter, et al. "Applying computational geometry techniques for advanced feature analysis in atom probe data." Ultramicroscopy 132 (2013): 100-106.

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