Rösner B, Schmidt U, Fink R (2017)
Publication Type: Journal article
Publication year: 2017
Book Volume: 849
Pages Range: 1-4
DOI: 10.1088/1742-6596/849/1/012016
We characterize individual Ag-TCNQ nanocrystals during switching their resistivity state in operando. Raman and soft X-ray absorption microspectroscopy are employed to disclose the electronic state of the organic component in dependency of applied voltage. Whereas Raman microspectroscopy offers qualitative insight into the conversion of negatively charged TCNQ molecules to their neutral counterpart, quantification of the neutral fraction can be achieved using X-ray absorption spectroscopy. These results allow a detailed investigation of resistivity switching in electrically bistable Ag-TCNQ nanocrystals.
APA:
Rösner, B., Schmidt, U., & Fink, R. (2017). In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy. Journal of Physics: Conference Series, 849, 1-4. https://doi.org/10.1088/1742-6596/849/1/012016
MLA:
Rösner, Benedikt, Ute Schmidt, and Rainer Fink. "In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy." Journal of Physics: Conference Series 849 (2017): 1-4.
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