Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)

Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L, Danzebrink H (1999)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1999

Journal

Surface and Interface Analysis Wiley-Blackwell

Publisher: John Wiley & Sons Ltd

City/Town: Chichester, United Kingdom

Book Volume: 27

Pages Range: 486-490

Event location: Basel, Switz

Journal Issue: 5

URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-0032643999&origin=inward

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente

How to cite

APA:

Dziomba, T., Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L., & Danzebrink, H. (1999). Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM). Surface and Interface Analysis, 27(5), 486-490.

MLA:

Dziomba, T., et al. "Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)." Surface and Interface Analysis 27.5 (1999): 486-490.

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