Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics

Weiss R, Frey L, Ryssel H (2004)

Publication Status: Published

Publication Type: Authored book, Volume of book series

Publication year: 2004

Pages Range: 973-976

Event location: Lyon

URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-8644276383&origin=inward

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente Heiner Ryssel Technische Fakultät

How to cite

APA:

Weiss, R., Frey, L., & Ryssel, H. (2004). Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics.

MLA:

Weiss, Roland, Lothar Frey, and Heiner Ryssel. Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics. 2004.

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