New atom probe approaches to studying segregation in nanocrystalline materials
Samudrala SK, Felfer P, Araullo-Peters VJ, Cao Y, Liao XZ, Cairney JM (2013)
Publication Status: Published
Publication Type: Journal article
Publication year: 2013
Journal
Publisher: Elsevier
Book Volume: 132
Pages Range: 158-163
DOI: 10.1016/j.ultramic.2012.12.013
Abstract
Atom probe is a technique that is highly suited to the study of nanocrystalline materials It can provide accurate atomic-scale information about the composition of grain boundaries in three dimensions. In this paper we have analysed the microstructure of a nanocrystalline super-duplex stainless steel prepared by high pressure torsion (HPT). Not all of the grain boundaries in this alloy display obvious segregation, making visualisation of the microstructure challenging. In addition, the grain boundaries present in the atom probe data acquired from this alloy have complex shapes that are curved at the scale of the dataset and the interfacial excess varies considerably over the boundaries, making the accurate characterisation of the distribution of solute challenging using existing analysis techniques. In this paper we present two new data treatment methods that allow the visualisation of boundaries with little or no segregation, the delineation of boundaries for further analysis and the quantitative analysis of Gibbsian interfacial excess at boundaries, including the capability of excess mapping. (C) 2013 Elsevier B.V. All rights reserved.
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Australia (AU)How to cite
APA:
Samudrala, S.K., Felfer, P., Araullo-Peters, V.J., Cao, Y., Liao, X.Z., & Cairney, J.M. (2013). New atom probe approaches to studying segregation in nanocrystalline materials. Ultramicroscopy, 132, 158-163. https://doi.org/10.1016/j.ultramic.2012.12.013
MLA:
Samudrala, S. K., et al. "New atom probe approaches to studying segregation in nanocrystalline materials." Ultramicroscopy 132 (2013): 158-163.
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