New approaches to nanoparticle sample fabrication for atom probe tomography

Felfer P, Li T, Eder K, Galinski H, Magyar AP, Bell DC, Smith GDW, Kruse N, Ringer SP, Cairney JM (2015)

Publication Status: Published

Publication Type: Conference contribution

Publication year: 2015

Journal

Ultramicroscopy Elsevier

Publisher: Elsevier

Book Volume: 159

Pages Range: 413-419

DOI: 10.1016/j.ultramic.2015.04.014

Abstract

Due to their unique properties, nano-sized materials such as nanoparticles and nanowires are receiving considerable attention. However, little data is available about their chemical makeup at the atomic scale, especially in three dimensions (3D). Atom probe tomography is able to answer many important questions about these materials if the challenge of producing a suitable sample can be overcome. In order to achieve this, the nanomaterial needs to be positioned within the end of a tip and fixed there so the sample possesses sufficient structural integrity for analysis. Here we provide a detailed description of various techniques that have been used to position nanoparticles on substrates for atom probe analysis. In some of the approaches, this is combined with deposition techniques to incorporate the particles into a solid matrix, and focused ion beam processing is then used to fabricate atom probe samples from this composite. Using these approaches, data has been achieved from 10-20 nm core-shell nanoparticles that were extracted directly from suspension (i.e. with no chemical modification) with a resolution of better than +/- 1 nm. (C) 2015 Elsevier B.V. All rights reserved.

Authors with CRIS profile

Peter Felfer Professur für Atom Probe Tomography

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Involved external institutions

University of Sydney (USYD) AU Australia (AU) University of Oxford GB United Kingdom (GB) Harvard University US United States (USA) (US) Université libre de Bruxelles (ULB) / Free University of Brussels BE Belgium (BE)

How to cite

APA:

Felfer, P., Li, T., Eder, K., Galinski, H., Magyar, A.P., Bell, D.C.,... Cairney, J.M. (2015). New approaches to nanoparticle sample fabrication for atom probe tomography. (pp. 413-419). Elsevier.

MLA:

Felfer, Peter, et al. "New approaches to nanoparticle sample fabrication for atom probe tomography." Elsevier, 2015. 413-419.

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