7 nm spatial resolution in soft x-ray microscopy

Rösner B, Koch F, Döring F, Guzenko VA, Meyer M, Lorona Ornelas J, Späth A, Fink RH, Stanescu S, Swaraj S, Belkhou R, Watts B, Raabe J, David C (2018)

Publication Type: Journal article, Original article

Publication year: 2018

Journal

Microscopy and Microanalysis Cambridge University Press (CUP)

Book Volume: 24

Pages Range: 270-271

Journal Issue: S2

DOI: 10.1017/S1431927618013697

Authors with CRIS profile

Markus Meyer Professur für Physikalische Chemie Joshua Lorona Ornelas Lehrstuhl für Physikalische Chemie II Andreas Späth FAU Competence Unit Engineering of Advanced Materials (EAM)

Involved external institutions

Paul Scherrer Institute (PSI) CH Switzerland (CH) Synchrotron SOLEIL FR France (FR)

How to cite

APA:

Rösner, B., Koch, F., Döring, F., Guzenko, V.A., Meyer, M., Lorona Ornelas, J.,... David, C. (2018). 7 nm spatial resolution in soft x-ray microscopy. Microscopy and Microanalysis, 24(S2), 270-271. https://doi.org/10.1017/S1431927618013697

MLA:

Rösner, Benedikt, et al. "7 nm spatial resolution in soft x-ray microscopy." Microscopy and Microanalysis 24.S2 (2018): 270-271.

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