On-the-fly scans for X-ray ptychography

Pelz PM, Guizar-Sicairos M, Thibault P, Johnson I, Holler M, Menzel A (2014)

Publication Type: Journal article

Publication year: 2014

Journal

Applied Physics Letters American Institute of Physics (AIP)

Book Volume: 105

Article Number: 251101

Journal Issue: 25

DOI: 10.1063/1.4904943

Abstract

With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.

Authors with CRIS profile

Philipp Pelz

Involved external institutions

Paul Scherrer Institute (PSI) CH Switzerland (CH) University College London (UCL) GB United Kingdom (GB)

How to cite

APA:

Pelz, P.M., Guizar-Sicairos, M., Thibault, P., Johnson, I., Holler, M., & Menzel, A. (2014). On-the-fly scans for X-ray ptychography. Applied Physics Letters, 105(25). https://doi.org/10.1063/1.4904943

MLA:

Pelz, Philipp M., et al. "On-the-fly scans for X-ray ptychography." Applied Physics Letters 105.25 (2014).

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