Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy

Journal article
(Letter)


Publication Details

Author(s): Wu M, Tafel A, Hommelhoff P, Spiecker E
Journal: Microscopy and Microanalysis
Publication year: 2019
Volume: 25
Journal issue: S2
Conference Proceedings Title: Microscopy and Microanalysis
Pages range: 74-75
ISSN: 1431-9276
Language: English


FAU Authors / FAU Editors

Hommelhoff, Peter Prof. Dr.
Lehrstuhl für Laserphysik
Spiecker, Erdmann Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)
Tafel, Alexander
Lehrstuhl für Laserphysik
Wu, Mingjian Dr.
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)


How to cite

APA:
Wu, M., Tafel, A., Hommelhoff, P., & Spiecker, E. (2019). Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25(S2), 74-75. https://dx.doi.org/10.1017/S1431927619001107

MLA:
Wu, Mingjian, et al. "Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 25.S2 (2019): 74-75.

BibTeX: 

Last updated on 2019-20-08 at 09:08