In-situ observation of dislocation dynamics near heterostructured interfaces

Zhou H, Huang C, Sha X, Xiao L, Ma X, Höppel HW, Göken M, Wu X, Ameyama K, Han X, Zhu Y (2019)


Publication Type: Journal article

Publication year: 2019

Journal

Book Volume: 7

Pages Range: 376-382

Journal Issue: 9

DOI: 10.1080/21663831.2019.1616330

Abstract

There has been a long-standing controversy on how dislocations interact with interfaces. Here we report in-situ observations that in a Cu-brass heterostructured TEM film Frank-Read sources are the primary dislocation sources. They were dynamically formed and deactivated throughout the deformation in grain interior, which has never been reported before. This observation indicates that strain gradient near interfaces cannot be quantitatively related to the density gradient of geometrically necessary dislocations, and it was primarily produced by Frank-Read source gradient instead of dislocation pile-ups. These findings provide new insights on how to design heterostructured interfaces to enhance mechanical properties.

Authors with CRIS profile

Additional Organisation(s)

Involved external institutions

How to cite

APA:

Zhou, H., Huang, C., Sha, X., Xiao, L., Ma, X., Höppel, H.W.,... Zhu, Y. (2019). In-situ observation of dislocation dynamics near heterostructured interfaces. Materials Research Letters, 7(9), 376-382. https://dx.doi.org/10.1080/21663831.2019.1616330

MLA:

Zhou, Hao, et al. "In-situ observation of dislocation dynamics near heterostructured interfaces." Materials Research Letters 7.9 (2019): 376-382.

BibTeX: Download