In-situ observation of dislocation dynamics near heterostructured interfaces

Journal article

Publication Details

Author(s): Zhou H, Huang C, Sha X, Xiao L, Ma X, Höppel HW, Göken M, Wu X, Ameyama K, Han X, Zhu Y
Journal: Materials Research Letters
Publication year: 2019
Volume: 7
Journal issue: 9
Pages range: 376-382
ISSN: 2166-3831


There has been a long-standing controversy on how dislocations interact with interfaces. Here we report in-situ observations that in a Cu-brass heterostructured TEM film Frank-Read sources are the primary dislocation sources. They were dynamically formed and deactivated throughout the deformation in grain interior, which has never been reported before. This observation indicates that strain gradient near interfaces cannot be quantitatively related to the density gradient of geometrically necessary dislocations, and it was primarily produced by Frank-Read source gradient instead of dislocation pile-ups. These findings provide new insights on how to design heterostructured interfaces to enhance mechanical properties.

FAU Authors / FAU Editors

Göken, Mathias Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)
Höppel, Heinz Werner PD Dr.-Ing.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

External institutions with authors

Beijing University of Technology / 北京工业大学
Chinese Academy of Sciences (CAS) / 中国科学院
Nanjing University of Science and Technology
North Carolina State University
Ritsumeikan University / 立命館大学
Sichuan University (SCU) / 四川大学

How to cite

Zhou, H., Huang, C., Sha, X., Xiao, L., Ma, X., Höppel, H.W.,... Zhu, Y. (2019). In-situ observation of dislocation dynamics near heterostructured interfaces. Materials Research Letters, 7(9), 376-382.

Zhou, Hao, et al. "In-situ observation of dislocation dynamics near heterostructured interfaces." Materials Research Letters 7.9 (2019): 376-382.


Last updated on 2019-29-06 at 00:08