Insights into fundamental deformation processes from advanced in situ transmission electron microscopy

Journal article


Publication Details

Author(s): Spiecker E, Oh SH, Shan ZW, Ikuhara Y, Mao SX
Journal: Mrs Bulletin
Publication year: 2019
Volume: 44
Journal issue: 6
Pages range: 443-449
ISSN: 0883-7694


Abstract

In situ nanomechanical testing in (scanning) transmission electron microscopy provides unique opportunities for studying fundamental deformation processes in materials. New insights have been gained by combining advanced imaging techniques with novel preparation methods and controlled loading scenarios. For instance, by applying in situ high-resolution imaging during tensile deformation of metallic nanostructures, the interplay of dislocation slip and surface diffusion has been identified as the key enabler of superplasticity. Evidence for dislocation pinning by hydrogen defect complexes has been provided by in situ imaging under cyclic pillar compression in a tunable gas environment. And, for the very first time, individual dislocations have been moved around in situ in two-dimensional materials by combining micromanipulation and imaging in a scanning electron microscope.


FAU Authors / FAU Editors

Spiecker, Erdmann Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)


Additional Organisation
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


External institutions with authors

Sungkyunkwan University (SKKU)
University of Pittsburgh
University of Tokyo
Xi’an Jiaotong-Liverpool University (XJTLU)


How to cite

APA:
Spiecker, E., Oh, S.H., Shan, Z.W., Ikuhara, Y., & Mao, S.X. (2019). Insights into fundamental deformation processes from advanced in situ transmission electron microscopy. Mrs Bulletin, 44(6), 443-449. https://dx.doi.org/10.1557/mrs.2019.129

MLA:
Spiecker, Erdmann, et al. "Insights into fundamental deformation processes from advanced in situ transmission electron microscopy." Mrs Bulletin 44.6 (2019): 443-449.

BibTeX: 

Last updated on 2019-01-08 at 16:17