The advantages of spatial domain probe compensation technique in EMC near-field measurements

Schmidt M, Albach M (2014)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2014

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 509-512

Article Number: 6997223

ISBN: 9784885522871

URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-84933500180&origin=inward

Authors with CRIS profile

Martin Schmidt Professur für Optoelektronik Manfred Albach Professur für Optoelektronik

How to cite

APA:

Schmidt, M., & Albach, M. (2014). The advantages of spatial domain probe compensation technique in EMC near-field measurements. In Proceedings of the 2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 (pp. 509-512). Institute of Electrical and Electronics Engineers Inc..

MLA:

Schmidt, Martin, and Manfred Albach. "The advantages of spatial domain probe compensation technique in EMC near-field measurements." Proceedings of the 2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 Institute of Electrical and Electronics Engineers Inc., 2014. 509-512.

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