Wüst M, Schwarz M, Eisenhart J, Nierla M, Rupitsch S (2019)
Publication Type: Journal article
Publication year: 2019
Book Volume: 104
Pages Range: 51-57
DOI: 10.1016/j.ndteint.2019.03.009
This contribution deals with an advanced synthetic aperture focusing technique for acoustic microscopy, which enables an almost precise reconstruction of the reflectivity distribution of both fluid-like and solid specimen. The presented approach is designed for single-element ultrasonic immersion transducers as they are commonly used in scanning acoustic microscopes. In practice, the resulting images offer at least lateral and axial resolutions of a focused image, which was acquired by a transducer with double center frequency. Moreover, the results show very low side lobe levels and the approach reconstructs the shape of inner defects even in images with present multiple reflections. A comparison with the well-known delay-and-sum technique reveals that the introduced approach offers a significantly more precise reconstruction of the given reflectivity distribution, especially when a complex reflectivity distribution is investigated. The advanced synthetic aperture focusing technique is applied to a generic test samples and to a curved multi-layered compound specimen.
APA:
Wüst, M., Schwarz, M., Eisenhart, J., Nierla, M., & Rupitsch, S. (2019). A matched model-based synthetic aperture focusing technique for acoustic microscopy. Ndt & E International, 104, 51-57. https://dx.doi.org/10.1016/j.ndteint.2019.03.009
MLA:
Wüst, Michael, et al. "A matched model-based synthetic aperture focusing technique for acoustic microscopy." Ndt & E International 104 (2019): 51-57.
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