Infrared Absorption Imaging of Water Ingress Into the Encapsulation of (Opto-)Electronic Devices

Journal article
(Original article)


Publication Details

Author(s): Hepp J, Vetter A, Langner S, Woiton M, Jovicic G, Burlafinger K, Hauch J, Camus C, Egelhaaf HJA, Brabec C
Journal: IEEE Journal of Photovoltaics
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication year: 2019
Volume: 9
Journal issue: 1
Pages range: 252-258
ISSN: 2156-3381
Language: English


Abstract

Water ingress into the encapsulation of electronic devices is a serious issue, especially for organic and perovskite-based electronics. In order to guide the development of suitable barrier materials and design, a reliable, fast, and non-destructive analysis tool is required. In this work, an imaging setup is presented, which is based on selective infrared (IR) radiation sources and a mid-IR sensitive camera that uses the absorption hand of water around 1920 nm and a reference band. This system enables us to monitor the distribution of water concentration inside the packaging of devices and its change over time. Our measurement is capable of detecting the local presence of water down to the mg/m(2) concentration range in a wide variety of encapsulation materials. The new tool allows identifying the pathways of moisture ingress into the encapsulation along with the corresponding diffusion coefficient. Thus, it provides fast and reliable analysis of humidity related failure mechanisms, and consequently helps to improve the design of encapsulation materials and processes.


FAU Authors / FAU Editors

Brabec, Christoph Prof. Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Burlafinger, Klaus
Institute Materials for Electronics and Energy Technology (i-MEET)
Camus, Christian Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Egelhaaf, Hans-Joachim Albert
Institute Materials for Electronics and Energy Technology (i-MEET)
Hauch, Jens Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Hepp, Johannes
Institute Materials for Electronics and Energy Technology (i-MEET)
Jovicic, Gordana Dr.-Ing.
Institute Materials for Electronics and Energy Technology (i-MEET)
Langner, Stefan
Institute Materials for Electronics and Energy Technology (i-MEET)
Vetter, Andreas Dr.
Institute Materials for Electronics and Energy Technology (i-MEET)
Woiton, Michael Dr.-Ing.
Institute Materials for Electronics and Energy Technology (i-MEET)


How to cite

APA:
Hepp, J., Vetter, A., Langner, S., Woiton, M., Jovicic, G., Burlafinger, K.,... Brabec, C. (2019). Infrared Absorption Imaging of Water Ingress Into the Encapsulation of (Opto-)Electronic Devices. IEEE Journal of Photovoltaics, 9(1), 252-258. https://dx.doi.org/10.1109/JPHOTOV.2018.2877883

MLA:
Hepp, Johannes, et al. "Infrared Absorption Imaging of Water Ingress Into the Encapsulation of (Opto-)Electronic Devices." IEEE Journal of Photovoltaics 9.1 (2019): 252-258.

BibTeX: 

Last updated on 2019-25-03 at 09:34