Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications

Conference contribution


Publication Details

Author(s): Luckner C, Magdalena H, Ritschl L, Maier A, Kappler S
Publication year: 2019
Volume: 10948
Conference Proceedings Title: Medical Imaging 2019: Physics of Medical Imaging
Pages range: 1094839


FAU Authors / FAU Editors

Luckner, Christoph
Lehrstuhl für Informatik 5 (Mustererkennung)
Maier, Andreas Prof. Dr.-Ing.
Lehrstuhl für Informatik 5 (Mustererkennung)


External institutions
Siemens AG, Healthcare Sector


How to cite

APA:
Luckner, C., Magdalena, H., Ritschl, L., Maier, A., & Kappler, S. (2019). Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications. In Medical Imaging 2019: Physics of Medical Imaging (pp. 1094839). San Diego, CA, USA.

MLA:
Luckner, Christoph, et al. "Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications." Proceedings of the SPIE: Medical Imaging, San Diego, CA, USA 2019. 1094839.

BibTeX: 

Last updated on 2019-18-03 at 13:53