In-Situ-Linearization for Instantaneous Frequency Measurement Systems

Scheiner B, Lurz F, Michler F, Weigel R, Kölpin A (2019)

Publication Language: English

Publication Status: Accepted

Publication Type: Conference contribution, Conference Contribution

Future Publication Type: Conference contribution

Publication year: 2019

Pages Range: 539-542

Event location: Paris FR

DOI: 10.23919/EuMC.2019.8910810

Authors with CRIS profile

Benedict Scheiner Lehrstuhl für Technische Elektronik Fabian Lurz Lehrstuhl für Technische Elektronik Fabian Michler Lehrstuhl für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik Alexander Kölpin Lehrstuhl für Technische Elektronik

How to cite

APA:

Scheiner, B., Lurz, F., Michler, F., Weigel, R., & Kölpin, A. (2019). In-Situ-Linearization for Instantaneous Frequency Measurement Systems. In Proceedings of the European Microwave Week 2019 (pp. 539-542). Paris, FR.

MLA:

Scheiner, Benedict, et al. "In-Situ-Linearization for Instantaneous Frequency Measurement Systems." Proceedings of the European Microwave Week 2019, Paris 2019. 539-542.

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