System Identification Methods for Refined Fault Detection in LVDC-Microgrids

Conference contribution
(Conference Contribution)


Publication Details

Author(s): Strobl C, Schäfer M, Rabenstein R
Publication year: 2019
Language: English


FAU Authors / FAU Editors

Rabenstein, Rudolf Prof. Dr.
Technische Fakultät
Schäfer, Maximilian
Lehrstuhl für Multimediakommunikation und Signalverarbeitung


External institutions with authors

E-T-A Elektrotechnische Apparate GmbH


How to cite

APA:
Strobl, C., Schäfer, M., & Rabenstein, R. (2019). System Identification Methods for Refined Fault Detection in LVDC-Microgrids. In Proceedings of the International Conference on DC Microgrids (ICDCM). Matsue, JP.

MLA:
Strobl, Christian, Maximilian Schäfer, and Rudolf Rabenstein. "System Identification Methods for Refined Fault Detection in LVDC-Microgrids." Proceedings of the International Conference on DC Microgrids (ICDCM), Matsue 2019.

BibTeX: 

Last updated on 2019-16-04 at 03:23