Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions

Xiao Y, Wehrs J, Ma H, Al-Samman T, Korte-Kerzel S, Göken M, Michler J, Spolenak R, Wheeler JM (2017)

Publication Status: Published

Publication Type: Journal article

Publication year: 2017

Journal

Scripta Materialia Elsevier

Publisher: PERGAMON-ELSEVIER SCIENCE LTD

Book Volume: 127

Pages Range: 191-194

DOI: 10.1016/j.scriptamat.2016.08.028

Abstract

Sample geometries for micro-mechanical testing, e.g. micro-pillars and micro-cantilevers are primarily produced using gallium focused ion beam technology. However, the effects of the gallium ions on the mechanical properties of metals which are embrittled by liquid metal gallium are still unknown. In this work, micro-compression samples from single crystalline and ultrafine-grained aluminum are fabricated using both xenon and/or gallium ions. The different ions have little effect on the yield strength of single crystalline aluminum. However, for the ultrafine-grained aluminum, the strength is reduced with increasing Ga dose, and considerable differences in the deformation morphology and resulting microstructures are observed. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Authors with CRIS profile

Mathias Göken Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Involved external institutions

Rheinisch-Westfälische Technische Hochschule (RWTH) Aachen DE Germany (DE) École Polytechnique Fédérale de Lausanne (EPFL) CH Switzerland (CH) Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology CH Switzerland (CH)

How to cite

APA:

Xiao, Y., Wehrs, J., Ma, H., Al-Samman, T., Korte-Kerzel, S., Göken, M.,... Wheeler, J.M. (2017). Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions. Scripta Materialia, 127, 191-194. https://dx.doi.org/10.1016/j.scriptamat.2016.08.028

MLA:

Xiao, Y., et al. "Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions." Scripta Materialia 127 (2017): 191-194.

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