A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics

Beitrag in einer Fachzeitschrift
(Review-Artikel)


Details zur Publikation

Autor(en): Talai A, Gold G, Frank M, Mann S, Weigel R, Kölpin A
Zeitschrift: Frequenz
Verlag: Walter de Gruyter GmbH
Jahr der Veröffentlichung: 2017
Band: 71
Heftnummer: 3-4
ISSN: 0016-1136
Sprache: Englisch


Abstract

Microwave Materials such as Rogers RO3003 are subject to process-related
fluctuations in terms of the relative permittivity and dielectric loss.
The behavior of high frequency circuits like patch-antenna arrays and
their distribution networks is dependent on the effective wavelength.
Therefore, fluctuations of the complex permittivity will influence the
resonance frequency and beam direction of the antennas. This paper
presents a grounded coplanar waveguide based sensor, which can measure
the complex permittivity at 77 GHz, as well as at other resonance
frequencies, by applying it on top of the manufactured depaneling. The
relative permittivity of the material under test (MUT) is a function of
the resonance frequency shift and the dielectric loss of the MUT can be
determined by transmission amplitude variations at the resonances. In
addition, the sensor is robust against floating ground metallizations on
inner printed circuit board layers, which are typically distributed
over the entire surface below antennas. Furthermore, the impact from
conductor surface roughness on the measured permittivity values is
determined using the Gradient Model.


FAU-Autoren / FAU-Herausgeber

Frank, Martin
Lehrstuhl für Technische Elektronik
Gold, Gerald Dr.-Ing.
Professur für Rechnergestützten Schaltungsentwurf
Kölpin, Alexander PD Dr.
Lehrstuhl für Technische Elektronik
Mann, Sebastian
Lehrstuhl für Technische Elektronik
Talai, Armin
Lehrstuhl für Technische Elektronik
Weigel, Robert Prof. Dr.-Ing.
Lehrstuhl für Technische Elektronik


Zitierweisen

APA:
Talai, A., Gold, G., Frank, M., Mann, S., Weigel, R., & Kölpin, A. (2017). A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics. Frequenz, 71(3-4). https://dx.doi.org/10.1515/freq-2016-0201

MLA:
Talai, Armin, et al. "A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics." Frequenz 71.3-4 (2017).

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