Layerwise monitoring of electron beam melting via backscatter electron detection

Journal article
(Original article)


Publication Details

Author(s): Arnold C, Pobel C, Osmanlic F, Körner C
Journal: Rapid Prototyping Journal
Publisher: Emerald Group Publishing Ltd.
Publication year: 2018
ISSN: 1355-2546
Language: English


Abstract

Purpose

The
purpose of this study is the introduction and validation of a new
technique for process monitoring during electron beam melting (EBM).

Design/methodology/approach

In
this study, a backscatter electron detector inside the building chamber
is used for image acquisition during EBM process. By systematic
variation of process parameters, the ability of displaying different
topographies, especially pores, is investigated. The results are
evaluated in terms of porosity and compared with optical microscopy and
X-ray computed tomography.

Findings

The method is capable of detecting major flaws (e.g. pores) and gives information about the quality of the resulting component.

Originality/value

Image
acquisition by evaluating backscatter electrons during EBM process is a
new approach in process monitoring which avoids disadvantages
restricting previously investigated techniques.



FAU Authors / FAU Editors

Arnold, Christopher
Lehrstuhl für Werkstoffwissenschaften (Werkstoffkunde und Technologie der Metalle)
Körner, Carolin Prof. Dr.-Ing.
Lehrstuhl für Werkstoffwissenschaften (Werkstoffkunde und Technologie der Metalle)
Osmanlic, Fuad
Zentralinstitut für Neue Materialien und Prozesstechnik
Pobel, Christoph
Lehrstuhl für Werkstoffwissenschaften (Werkstoffkunde und Technologie der Metalle)


Research Fields

Additive Manufacturing
Lehrstuhl für Werkstoffwissenschaften (Werkstoffkunde und Technologie der Metalle)


How to cite

APA:
Arnold, C., Pobel, C., Osmanlic, F., & Körner, C. (2018). Layerwise monitoring of electron beam melting via backscatter electron detection. Rapid Prototyping Journal. https://dx.doi.org/10.1108/RPJ-02-2018-0034

MLA:
Arnold, Christopher, et al. "Layerwise monitoring of electron beam melting via backscatter electron detection." Rapid Prototyping Journal (2018).

BibTeX: 

Last updated on 2019-06-01 at 21:10