A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing

Conference contribution
(Original article)


Publication Details

Author(s): Stadler C, Flamm X, Gruber T, Djanatliev A, German R, Eckhoff D
Publisher: IEEE
Publication year: 2017
Conference Proceedings Title: Proceedings of the 2017 IEEE Vehicular Networking Conference (VNC)
Pages range: 195-202
ISBN: 978-1-5386-0986-6
ISSN: 2157-9865
Language: English


Abstract

Many of the envisioned applications based on Vehicle-to-Vehicle (V2V)
communication require a certain amount of information received from
other road users. Urban scenarios pose a particular challenge to the
communication quality for Vehicular Ad-Hoc Networks (VANETs) as
obstacles such as buildings, foliage, and infrastructure attenuate the
signal. These challenges have to be taken into account already at the
development stage of applications. In this paper we introduce a
wall-clock time test approach which is capable of emulating the
availability of information depending on the topology of an urban
scenario. To this end, we make use of a neural network to predict
LOS/NLOS probabilities which can then in turn be used to predict packet
success rates. Our method achieves a high prediction accuracy that
enables the realistic testing of a device-under-test in terms of
communication and computational load.


FAU Authors / FAU Editors

Djanatliev, Anatoli Dr.-Ing.
Computer Science 7 (Computer Networks and Communication Systems)
Eckhoff, David
Computer Science 7 (Computer Networks and Communication Systems)
German, Reinhard Prof. Dr.
Computer Science 7 (Computer Networks and Communication Systems)
Stadler, Christina
Computer Science 7 (Computer Networks and Communication Systems)


External institutions with authors

Audi AG
Rheinische Friedrich-Wilhelms-Universität Bonn


Research Fields

Connected Mobility
Computer Science 7 (Computer Networks and Communication Systems)


How to cite

APA:
Stadler, C., Flamm, X., Gruber, T., Djanatliev, A., German, R., & Eckhoff, D. (2017). A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. In Proceedings of the 2017 IEEE Vehicular Networking Conference (VNC) (pp. 195-202). Torino, IT: IEEE.

MLA:
Stadler, Christina, et al. "A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing." Proceedings of the 2017 IEEE Vehicular Networking Conference (VNC), Torino IEEE, 2017. 195-202.

BibTeX: 

Last updated on 2019-22-07 at 07:35