Embedded Fluorescence Lifetime Determination for High-Throughput, Low-Photon-Number Applications

Lieske T, Uhring W, Dumas N, Skilitsi AI, Leonard J, Fey D (2018)

Publication Type: Journal article, Original article

Publication year: 2018

Journal

Journal of Signal Processing Systems Springer

Book Volume: 91

Pages Range: 819--831

Journal Issue: 7

DOI: 10.1007/s11265-018-1372-9

Authors with CRIS profile

Tobias Lieske Lehrstuhl für Informatik 3 (Rechnerarchitektur) Dietmar Fey Lehrstuhl für Informatik 3 (Rechnerarchitektur)

Involved external institutions

Université de Strasbourg (UDS) FR France (FR)

How to cite

APA:

Lieske, T., Uhring, W., Dumas, N., Skilitsi, A.I., Leonard, J., & Fey, D. (2018). Embedded Fluorescence Lifetime Determination for High-Throughput, Low-Photon-Number Applications. Journal of Signal Processing Systems, 91(7), 819--831. https://dx.doi.org/10.1007/s11265-018-1372-9

MLA:

Lieske, Tobias, et al. "Embedded Fluorescence Lifetime Determination for High-Throughput, Low-Photon-Number Applications." Journal of Signal Processing Systems 91.7 (2018): 819--831.

BibTeX: Download