A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies
Conference contribution
Publication Details
Author(s): Distler F, Schür JS, Vossiek M
Publication year: 2018
Conference Proceedings Title: Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018)
Language: English
FAU Authors / FAU Editors
| | | Lehrstuhl für Hochfrequenztechnik |
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| Schür, Jan Steffen Dr.-Ing. |
| | Lehrstuhl für Hochfrequenztechnik |
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| Vossiek, Martin Prof. Dr.-Ing. |
| | Lehrstuhl für Hochfrequenztechnik |
|
How to cite
APA: | Distler, F., Schür, J.S., & Vossiek, M. (2018). A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies. In Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018). |
MLA: | Distler, Felix, Jan Steffen Schür, and Martin Vossiek. "A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies." Proceedings of the Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018) 2018. |