A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies

Conference contribution


Publication Details

Author(s): Distler F, Schür JS, Vossiek M
Publication year: 2018
Conference Proceedings Title: Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018)
Language: English


FAU Authors / FAU Editors

Distler, Felix
Lehrstuhl für Hochfrequenztechnik
Schür, Jan Steffen Dr.-Ing.
Lehrstuhl für Hochfrequenztechnik
Vossiek, Martin Prof. Dr.-Ing.
Lehrstuhl für Hochfrequenztechnik


How to cite

APA:
Distler, F., Schür, J.S., & Vossiek, M. (2018). A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies. In Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018).

MLA:
Distler, Felix, Jan Steffen Schür, and Martin Vossiek. "A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies." Proceedings of the Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018) 2018.

BibTeX: 

Last updated on 2018-11-08 at 02:12