A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies

Distler F, Schür J, Vossiek M (2018)


Publication Language: English

Publication Type: Conference contribution

Publication year: 2018

Conference Proceedings Title: Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018)

DOI: 10.23919/eumc.2018.8541393

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How to cite

APA:

Distler, F., Schür, J., & Vossiek, M. (2018). A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies. In Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018).

MLA:

Distler, Felix, Jan Schür, and Martin Vossiek. "A Flexible Measurement System for Dielectric Waveguide Charaterization at mmW Frequencies." Proceedings of the Proceedings of the 48th European Microwave Conference 2018 (EuMC 2018) 2018.

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