In-Depth Characterization of a Dielectric Waveguide for mmW Transmission Line Applications

Distler F, Schür J, Vossiek M (2018)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2018

Conference Proceedings Title: Proceedings of the 22nd IEEE Workshop on Signal and Power Integrity (SPI 2018)

DOI: 10.1109/SaPIW.2018.8401671

Authors with CRIS profile

Felix Distler Lehrstuhl für Hochfrequenztechnik Jan Steffen Schür Lehrstuhl für Hochfrequenztechnik Martin Vossiek Lehrstuhl für Hochfrequenztechnik

How to cite

APA:

Distler, F., Schür, J., & Vossiek, M. (2018). In-Depth Characterization of a Dielectric Waveguide for mmW Transmission Line Applications. In Proceedings of the 22nd IEEE Workshop on Signal and Power Integrity (SPI 2018).

MLA:

Distler, Felix, Jan Schür, and Martin Vossiek. "In-Depth Characterization of a Dielectric Waveguide for mmW Transmission Line Applications." Proceedings of the Proceedings of the 22nd IEEE Workshop on Signal and Power Integrity (SPI 2018) 2018.

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