An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses

Lau I, Frank M, Shi K, Lurz F, Talai A, Weigel R, Kölpin A (2018)

Publication Language: English

Publication Status: Accepted

Publication Type: Conference contribution, Conference Contribution

Future Publication Type: Conference contribution

Publication year: 2018

Pages Range: 202-205

Event location: Madrid

URI: https://ieeexplore.ieee.org/document/8541437

DOI: 10.23919/EuMC.2018.8541437

Abstract

This paper presents an accurate free space method for material characterization eliminating the problem
of the required precise orientation between the material and the antennas and expanding the unambiguous range for electrical thick samples. It includes theoretical considerations and measurement results of four different materials. Overall, a maximum measurement uncertainty of 0.0153 for the relative permittivity and 0.001 for the loss tangent in the W-band can be achieved. Depending on the variation of the material’s thickness, the implemented setup changes lead to an reduction of the measurement uncertainty of 8 to 58%.

Authors with CRIS profile

How to cite

APA:

Lau, I., Frank, M., Shi, K., Lurz, F., Talai, A., Weigel, R., & Kölpin, A. (2018). An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses. In Proceedings of the European Microwave Conference (EuMC) (pp. 202-205). Madrid, ES.

MLA:

Lau, Isabella, et al. "An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses." Proceedings of the European Microwave Conference (EuMC), Madrid 2018. 202-205.

BibTeX: Download