Double aberration correction in a low-energy electron microscope

Journal article
(Original article)

Publication Details

Author(s): Schmidt T, Marchetto H, Levesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ
Journal: Ultramicroscopy
Publisher: Elsevier
Publication year: 2010
Volume: 110
Journal issue: 11
Pages range: 1358-1361
ISSN: 0304-3991


The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4. nm for the first time. This breakthrough has only been possible by simultaneously correcting the unavoidable spherical and chromatic aberrations of the lens system. We present an experimental criterion to quantify the aberration correction and to optimize the electron optical system. The obtained lateral resolution of 2.6. nm in LEEM enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(1. 1. 1) surface. © 2010 Elsevier B.V.

FAU Authors / FAU Editors

Fink, Rainer Prof. Dr.
Professur für Physikalische Chemie

External institutions with authors

Fritz-Haber-Institut der Max-Planck-Gesellschaft (FHI)
Julius-Maximilians-Universität Würzburg
Technische Universität Clausthal
Technische Universität Darmstadt

How to cite

Schmidt, T., Marchetto, H., Levesque, P.L., Groh, U., Maier, F., Preikszas, D.,... Freund, H.-J. (2010). Double aberration correction in a low-energy electron microscope. Ultramicroscopy, 110(11), 1358-1361.

Schmidt, Th, et al. "Double aberration correction in a low-energy electron microscope." Ultramicroscopy 110.11 (2010): 1358-1361.


Last updated on 2019-15-04 at 14:50