Schmidt T, Marchetto H, Levesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ (2010)
Publication Type: Journal article, Original article
Publication year: 2010
Original Authors: Schmidt T., Marchetto H., Levesque P.L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E., Freund H.-J.
Publisher: Elsevier
Book Volume: 110
Pages Range: 1358-1361
Journal Issue: 11
DOI: 10.1016/j.ultramic.2010.07.007
The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4. nm for the first time. This breakthrough has only been possible by simultaneously correcting the unavoidable spherical and chromatic aberrations of the lens system. We present an experimental criterion to quantify the aberration correction and to optimize the electron optical system. The obtained lateral resolution of 2.6. nm in LEEM enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(1. 1. 1) surface. © 2010 Elsevier B.V.
APA:
Schmidt, T., Marchetto, H., Levesque, P.L., Groh, U., Maier, F., Preikszas, D.,... Freund, H.-J. (2010). Double aberration correction in a low-energy electron microscope. Ultramicroscopy, 110(11), 1358-1361. https://dx.doi.org/10.1016/j.ultramic.2010.07.007
MLA:
Schmidt, Th, et al. "Double aberration correction in a low-energy electron microscope." Ultramicroscopy 110.11 (2010): 1358-1361.
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