Double aberration correction in a low-energy electron microscope
Schmidt T, Marchetto H, Levesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ (2010)
Publication Type: Journal article, Original article
Publication year: 2010
Journal
Original Authors: Schmidt T., Marchetto H., Levesque P.L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E., Freund H.-J.
Publisher: Elsevier
Book Volume: 110
Pages Range: 1358-1361
Journal Issue: 11
DOI: 10.1016/j.ultramic.2010.07.007
Abstract
The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4. nm for the first time. This breakthrough has only been possible by simultaneously correcting the unavoidable spherical and chromatic aberrations of the lens system. We present an experimental criterion to quantify the aberration correction and to optimize the electron optical system. The obtained lateral resolution of 2.6. nm in LEEM enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(1. 1. 1) surface. © 2010 Elsevier B.V.
Authors with CRIS profile
Involved external institutions
Fritz-Haber-Institut der Max-Planck-Gesellschaft (FHI)
Germany (DE)
Julius-Maximilians-Universität Würzburg
Germany (DE)
Technische Universität Darmstadt
Germany (DE)
Technische Universität Clausthal / Clausthal University of Technology
Germany (DE)
Germany (DE)
Julius-Maximilians-Universität Würzburg
Germany (DE)
Technische Universität Darmstadt
Germany (DE)
Technische Universität Clausthal / Clausthal University of Technology
Germany (DE)
How to cite
APA:
Schmidt, T., Marchetto, H., Levesque, P.L., Groh, U., Maier, F., Preikszas, D.,... Freund, H.-J. (2010). Double aberration correction in a low-energy electron microscope. Ultramicroscopy, 110(11), 1358-1361. https://dx.doi.org/10.1016/j.ultramic.2010.07.007
MLA:
Schmidt, Th, et al. "Double aberration correction in a low-energy electron microscope." Ultramicroscopy 110.11 (2010): 1358-1361.
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