Sensing current and forces with SPM

Journal article

Publication Details

Author(s): Park JY, Maier S, Hendriksen B, Salmeron M
Journal: Materials Today
Publication year: 2010
Volume: 13
Journal issue: 10
Pages range: 38-45
ISSN: 1369-7021
eISSN: 1873-4103
Language: English


Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.

FAU Authors / FAU Editors

Maier, Sabine Prof. Dr.
Professur für Experimentalphysik (Rastersondenmikroskopie)

How to cite

Park, J.Y., Maier, S., Hendriksen, B., & Salmeron, M. (2010). Sensing current and forces with SPM. Materials Today, 13(10), 38-45.

Park, Jeong Y., et al. "Sensing current and forces with SPM." Materials Today 13.10 (2010): 38-45.


Last updated on 2019-01-08 at 15:17