Sensing current and forces with SPM

Beitrag in einer Fachzeitschrift

Details zur Publikation

Autorinnen und Autoren: Park JY, Maier S, Hendriksen B, Salmeron M
Zeitschrift: Materials Today
Jahr der Veröffentlichung: 2010
Band: 13
Heftnummer: 10
Seitenbereich: 38-45
ISSN: 1369-7021
eISSN: 1873-4103
Sprache: Englisch


Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.

FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Maier, Sabine Prof. Dr.
Professur für Experimentalphysik (Rastersondenmikroskopie)


Park, J.Y., Maier, S., Hendriksen, B., & Salmeron, M. (2010). Sensing current and forces with SPM. Materials Today, 13(10), 38-45.

Park, Jeong Y., et al. "Sensing current and forces with SPM." Materials Today 13.10 (2010): 38-45.


Zuletzt aktualisiert 2019-01-08 um 15:17

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