Sensing current and forces with SPM

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autorinnen und Autoren: Park JY, Maier S, Hendriksen B, Salmeron M
Zeitschrift: Materials Today
Verlag: ELSEVIER SCI LTD
Jahr der Veröffentlichung: 2010
Band: 13
Heftnummer: 10
Seitenbereich: 38-45
ISSN: 1369-7021
Sprache: Englisch


Abstract


Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.



FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Maier, Sabine Prof. Dr.
Professur für Experimentalphysik (Rastersondenmikroskopie)


Zitierweisen

APA:
Park, J.Y., Maier, S., Hendriksen, B., & Salmeron, M. (2010). Sensing current and forces with SPM. Materials Today, 13(10), 38-45. https://dx.doi.org/10.1016/S1369-7021(10)70185-1

MLA:
Park, Jeong Y., et al. "Sensing current and forces with SPM." Materials Today 13.10 (2010): 38-45.

BibTeX: 

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