A new approach to the determination of concentration profiles in atom probe tomography
Felfer P, Gault B, Sha G, Stephenson L, Ringer SP, Cairney JM (2012)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2012
Journal
Publisher: Cambridge University Press (CUP)
Book Volume: 18
Pages Range: 359-364
Journal Issue: 2
DOI: 10.1017/S1431927611012530
Abstract
Abstract Atom probe tomography (APT) provides three-dimensional analytical imaging of materials with near-atomic resolution using pulsed field evaporation. The processes of field evaporation can cause atoms to be placed at positions in the APT reconstruction that can deviate slightly from their original site in the material. Here, we describe and model one such process-that of preferential retention of solute atoms in multicomponent systems. Based on relative field evaporation probabilities, we calculate the point spread function for the solute atom distribution in the "z," or in-depth direction, and use this to extract more accurate solute concentration profiles. © 2012 Microscopy Society of America.
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APA:
Felfer, P., Gault, B., Sha, G., Stephenson, L., Ringer, S.P., & Cairney, J.M. (2012). A new approach to the determination of concentration profiles in atom probe tomography. Microscopy and Microanalysis, 18(2), 359-364. https://dx.doi.org/10.1017/S1431927611012530
MLA:
Felfer, Peter, et al. "A new approach to the determination of concentration profiles in atom probe tomography." Microscopy and Microanalysis 18.2 (2012): 359-364.
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