Intermetallic compounds dynamic formation during annealing of stacked elemental layers and its influences on the crystallization of Cu2ZnSnSe4 films

Journal article


Publication Details

Author(s): Wibowo RA, Möckel S, Yoo HS, Hetzner C, Hölzing A, Wellmann P, Hock R
Journal: Materials Chemistry and Physics
Publisher: Elsevier
Publication year: 2013
Volume: 142
Journal issue: 1
Pages range: 311-317
ISSN: 0254-0584
Language: English


Abstract


A combined in-situ investigation using X-ray diffraction and differential scanning calorimetry during annealing was carried out to investigate the formation of intermetallic compounds in the stacked elemental layers and to reveal its influences on the crystallization of kesterite Cu2ZnSnSe4. The Mo/Cu/Zn, Mo/Cu/Sn/Zn, Mo/Cu/Zn/Se and Mo/Cu/Sn/Zn/Se stacked films were prepared with a composition resembling a typical kesterite Cu-poor and Zn-rich metallic composition. In-situ experiments during annealing of pure metallic stacked films reveal a dynamic intermetallic compounds formation of Cu5Zn8 -> CuZn -> Cu2Zn -> Cu3Zn and Cu6Sn5 -> Cu41Sn11. The Cu-Zn and Cu5Zn8 layer formed at the interface of metals/Se may prevent the stacked metallic layers from selenization below 320 degrees C. On the other side, the dynamic formation of Cu-Zn phases in the stacked films is found to be an origin of a ZnSe gradual formation starting from 320 degrees C. Phase analysis suggests that the ternary Cu2SnSe3 phase forms almost immediately after the formation of Cu2Se and SnSe. The formation of Cu2SnSe3 is indicated by the consumption of SnSe by the Cu2Se which occurs at 530-540 degrees C. Crystallization of kesterite takes place above 540 degrees C. On a phenomenological basis of present results, consequences for the thin film kesterite fabrication for solar cell application are discussed. (C) 2013 Elsevier B.V. All rights reserved.



FAU Authors / FAU Editors

Hock, Rainer Prof. Dr.
Professur für Kristallographie und Strukturphysik
Hölzing, Astrid
Professur für Kristallographie und Strukturphysik
Möckel, Stefan
Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)
Wellmann, Peter Prof. Dr.-Ing.
Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)
Yoo, Hye Sun
Professur für Kristallographie und Strukturphysik


How to cite

APA:
Wibowo, R.A., Möckel, S., Yoo, H.S., Hetzner, C., Hölzing, A., Wellmann, P., & Hock, R. (2013). Intermetallic compounds dynamic formation during annealing of stacked elemental layers and its influences on the crystallization of Cu2ZnSnSe4 films. Materials Chemistry and Physics, 142(1), 311-317. https://dx.doi.org/10.1016/j.matchemphys.2013.07.021

MLA:
Wibowo, Rachmat Adhi, et al. "Intermetallic compounds dynamic formation during annealing of stacked elemental layers and its influences on the crystallization of Cu2ZnSnSe4 films." Materials Chemistry and Physics 142.1 (2013): 311-317.

BibTeX: 

Last updated on 2019-18-07 at 07:22

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