The Best of Both Worlds: Merging the Benefits of Rack&Stack and Universal ATE

Conference contribution

Publication Details

Author(s): Lu P, Glaser D, Uygur G, Helmreich K
Title edited volumes: Proceedings - International Test Conference
Publisher: Institute of Electrical and Electronics Engineers
Publication year: 2009
Conference Proceedings Title: Conference Proceedings
Pages range: L 3.2
ISBN: 978-1-4244-4867-8
ISSN: 1089-3539
Language: English


Test cost is and will continue to be one of the most important issues, especially in testing analog, mixed-signal and RF devices. When considering overall test cost, the key factors are low cost test equipment, low cost of ownership and low test development cost. Universal ATE ('big iron') is associated with high equipment cost but its powerful SW enables cost-efficient test development. Rack&Stack systems, on the other hand, can be assembled from inexpensive components, but load test engineers with much higher effort for test development and debug. This paper describes a concept that promises to combine the respective advantages of Rack&Stack and universal test systems by establishing a versatile test platform in HW based on industry standards enabling modular, least-cost, application-specific configuration with a likewise standard based SW environment for efficient test generation and debug, inherently supporting virtual test and test synthesis from formal specification. © 2009 IEEE.

FAU Authors / FAU Editors

Glaser, Daniel
Professur für Rechnergestützten Schaltungsentwurf
Helmreich, Klaus Prof. Dr.-Ing.
Professur für Rechnergestützten Schaltungsentwurf
Lu, Ping
Professur für Rechnergestützten Schaltungsentwurf
Uygur, Gürkan
Lehrstuhl für Zuverlässige Schaltungen und Systeme

How to cite

Lu, P., Glaser, D., Uygur, G., & Helmreich, K. (2009). The Best of Both Worlds: Merging the Benefits of Rack&Stack and Universal ATE. In Conference Proceedings (pp. L 3.2). Austin, Texas: Institute of Electrical and Electronics Engineers.

Lu, Ping, et al. "The Best of Both Worlds: Merging the Benefits of Rack&Stack and Universal ATE." Proceedings of the International Test Conference 2009, Austin, Texas Institute of Electrical and Electronics Engineers, 2009. L 3.2.


Last updated on 2018-09-08 at 22:26