Integrated Test for Silicon Front Ends

Kissinger D, Lämmle B, Maurer L, Weigel R (2010)

Publication Type: Journal article

Publication year: 2010

Journal

IEEE Microwave Magazine Institute of Electrical and Electronics Engineers (IEEE)

Publisher: IEEE

Book Volume: 11

Pages Range: 87-94

Journal Issue: 3

DOI: 10.1109/MMM.2010.936076

Abstract

Silicon-based technologies have enabled the monolithic integration of transceiver circuits with operational frequencies up into the millimeter-wave regime. While high integration relaxes the requirements on RF chip-to-chip interconnects and external circuitry, it imposes serious challenges upon the traceability of failure mechanisms and functional errors of the individual building blocks that comprise the front-end. Additionally, expensive external measurement equipment in combination with complex, error-prone, and time-consuming calibration procedures, necessitates the development of on-chip test modules. It has been shown that a variety of built-in test schemes are currently the topic of research for both the mixed-signal and microwave domain. Solutions for the individual building blocks that will enable direct verification of performance parameters have been presented throughout this article. Current RF transceiver architectures will require a mixture of both paradigms for successful implementation of integrated test strategies. It is the authors' belief that the application of such concepts is a must for future integrated transceiver systems to meet the stringent requirements of time-to-market and low-cost of mass market consumer products.

Authors with CRIS profile

Dietmar Kissinger Lehrstuhl für Technische Elektronik Benjamin Lämmle Lehrstuhl für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik

Involved external institutions

Universität der Bundeswehr München

Germany (DE)

How to cite

APA:

Kissinger, D., Lämmle, B., Maurer, L., & Weigel, R. (2010). Integrated Test for Silicon Front Ends. IEEE Microwave Magazine, 11(3), 87-94. https://dx.doi.org/10.1109/MMM.2010.936076

MLA:

Kissinger, Dietmar, et al. "Integrated Test for Silicon Front Ends." IEEE Microwave Magazine 11.3 (2010): 87-94.

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